| 摘要 |
An x-ray measuring apparatus comprises an x-ray source, an x-ray detector, a rotating device, and a processor. The x-ray source generates x-rays to be emitted to a subject. The x-ray detector detects measurement data regarding the subject. The rotating device changes a relative position of the x-ray source and the x-ray detector with respect to the subject. The x-ray detector is shifted by a distance shorter than half the length of the x-ray detector along a line parallel to the plane of rotation, in a tangential direction of the plane of rotation generated by the x-ray source. The processor obtains projection data by executing a logarithmic converting process for the measurement data, multiplies a value of the projection data by a weight, and obtains reconstructed data therefrom.
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