发明名称 Chemical mechanical polishing pad for polishing semiconductor substrates, comprises polymeric matrix formed of water-based polymer(s) and microspheres dispersed in polymer matrix
摘要 <p>A chemical mechanical polishing pad (300) comprises a polymeric matrix having microspheres dispersed in it. The polymeric matrix is formed of water-based polymer(s). An independent claim is included for manufacture of chemical mechanical polishing pad which involves supplying a water-based fluid phase polymer composition containing microspheres onto a continuous transported backing layer (302), shaping the polymer composition on the backing layer into a fluid phase polishing layer (304) having preset thickness, and curing the polymer composition on the backing layer in a curing oven to convert the polymer composition to a solid phase polishing layer of the polishing pad.</p>
申请公布号 FR2882952(A1) 申请公布日期 2006.09.15
申请号 FR20060050787 申请日期 2006.03.07
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC 发明人 DUONG CHAU H;JAMES DAVID B
分类号 B24D3/32;B24B37/24;B24D99/00;C09G1/02;H01L21/306 主分类号 B24D3/32
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