发明名称 |
Chemical mechanical polishing pad for polishing semiconductor substrates, comprises polymeric matrix formed of water-based polymer(s) and microspheres dispersed in polymer matrix |
摘要 |
<p>A chemical mechanical polishing pad (300) comprises a polymeric matrix having microspheres dispersed in it. The polymeric matrix is formed of water-based polymer(s). An independent claim is included for manufacture of chemical mechanical polishing pad which involves supplying a water-based fluid phase polymer composition containing microspheres onto a continuous transported backing layer (302), shaping the polymer composition on the backing layer into a fluid phase polishing layer (304) having preset thickness, and curing the polymer composition on the backing layer in a curing oven to convert the polymer composition to a solid phase polishing layer of the polishing pad.</p> |
申请公布号 |
FR2882952(A1) |
申请公布日期 |
2006.09.15 |
申请号 |
FR20060050787 |
申请日期 |
2006.03.07 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC |
发明人 |
DUONG CHAU H;JAMES DAVID B |
分类号 |
B24D3/32;B24B37/24;B24D99/00;C09G1/02;H01L21/306 |
主分类号 |
B24D3/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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