| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a Bi<SB>12</SB>TiO<SB>20</SB>sintered compact capable of realizing high sensitivity as a photoconductive layer constituting a radiation image pickup panel for recording radiation image information as electrostatic latent images. <P>SOLUTION: In the Bi<SB>12</SB>TiO<SB>20</SB>sintered compact, Bi<SB>12</SB>TiO<SB>20</SB>powder is sintered at ≥700°C and <800°C or the different phase of a Bi<SB>12</SB>TiO<SB>20</SB>sintered compact surface is removed so that the strength ratio of the strongest peak of an X-ray diffraction pattern by the different phase other than a Bi<SB>12</SB>TiO<SB>20</SB>phase to the strongest peak of the X-ray diffraction pattern by the Bi<SB>12</SB>TiO<SB>20</SB>phase becomes ≤1/100. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
