发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve amount of substrate noise absorbed by a guard ring and prevent erroneous operation due to substrate noise in a semiconductor device comprising an SOI substrate provided with the guard ring. SOLUTION: The semiconductor device comprises the SOI substrate on which a supporting substrate 10, an insulating layer 11, and an SOI layer 12 are sequentially laminated, an element region 4 provided to a region of the SOI substrate, and a guard ring region 8 provided to the circumference of the element region 4 of the SOI substrate. Moreover, in this semiconductor device, a first diffusing layer 15 provided in the SOI layer 12 of the element region 4, and a second diffusing layer 26 provided in the SOI layer 12 of the guard ring region 8, are electrically connected. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006245196(A) 申请公布日期 2006.09.14
申请号 JP20050057294 申请日期 2005.03.02
申请人 NEC ELECTRONICS CORP 发明人 YAMAMOTO RYOTA;AKIYAMA YUTAKA;FURUMIYA MASAYUKI
分类号 H01L21/762;H01L21/76 主分类号 H01L21/762
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