| 摘要 |
PROBLEM TO BE SOLVED: To provide a test fixture that suppresses damage of a conductor pattern even when an electronic device is repeatedly inserted or removed, can achieve extension of the service life by suppressing the deformation or damage without applying a force in the surface direction of a substrate at a lead contact time, and has high degree of freedom for holding a contact member. SOLUTION: This test fixture 1 measures electrical characteristics of the electronic device 2 having a lead 3. This test fixture 1 comprises a first transmission line 5 that has the lead 2 and is aligned so that the characteristic impedance is a predetermined value, a second transmission line 6 that is constituted on a surface orthogonal to the first transmission line 5 and has a conductor pattern 10 on the surface, and a contact member 7 of a substantially L-shaped section that is disposed at one end section close to the first transmission line 5 on the second transmission line 6, has one contact section 11 coming into contact with the conductor pattern 10, and has the other contact section 12 with which the tip of the lead 3 comes into contact. COPYRIGHT: (C)2006,JPO&NCIPI
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