发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To improve the contrast on forming a resist pattern. <P>SOLUTION: The positive resist composition contains a resin component (A) having an acid dissociable dissolution inhibiting group and having the alkali solubility increased by the effect of an acid, an acid generating agent component (B) which generates an acid by exposure, and a compound (C) expressed by general formula (1). In formula (1), R<SP>1</SP>represents a 1-5C straight-chain or branched alkylene group; R<SP>2</SP>represents an acid dissociable dissolution inhibiting group; R<SP>3</SP>represents a hydrogen atom or a 1-4C straight-chain or branched alkyl group; and n represents an integer 1 to 3. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006235530(A) 申请公布日期 2006.09.07
申请号 JP20050053916 申请日期 2005.02.28
申请人 TOKYO OHKA KOGYO CO LTD 发明人 SEO TAKEHITO;FUJITA SHOICHI
分类号 G03F7/004;C08F212/14;G03F7/039;H01L21/027 主分类号 G03F7/004
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