发明名称 DUAL-BIT NON-VOLATILE MEMORY CELL AND METHOD OF MAKING THE SAME
摘要 A non-volatile memory cell having a local silicon nitride layer to control dispersion of hot electrons is disclosed. The dual-bit non-volatile memory cell has a stack of layers including silicon on the surface of a substrate. The stack of layers has at least one first oxide silicon layer and a silicon nitride layer overlying the first oxide silicon layer. An opening is formed in the stack of layers and a gate oxide layer is deposited on the surface of the substrate within the opening. A control gate is formed on the gate oxide layer followed by a second oxide silicon layer overlying the surfaces of the control gate and the stack of layers. A second polysilicon layer is formed overlying the gate oxide layer. Dual split-gates are then formed on the second polysilicon layer.
申请公布号 US2006199356(A1) 申请公布日期 2006.09.07
申请号 US20060306737 申请日期 2006.01.09
申请人 SHIH PING-CHIA;HSIEH SHOU-WEI 发明人 SHIH PING-CHIA;HSIEH SHOU-WEI
分类号 H01L29/94;H01L21/326 主分类号 H01L29/94
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