发明名称 ABNORMALITY DIAGNOSTIC DEVICE AND ABNORMALITY DIAGNOSTIC METHOD FOR MECHANICAL FACILITY
摘要 PROBLEM TO BE SOLVED: To provide an abnormality diagnostic device and an abnormality diagnostic method for a mechanical facility, capable of specifying the presence of abnormality and an abnormal portion, while securing diagnostic accuracy, even when an actual rotation speed is not able to be fetched directly. SOLUTION: This abnormality diagnostic device for the mechanical facility 10, provided with at least one rotating or sliding component 12, is provided with at least one detection part 20 for outputting as an electrical signal a signal generated in the mechanical facility 10, and a signal processing part 32 for frequency analysis of a waveform of the electrical signal, for comparison-collating the frequency components of actual spectrum data obtained by the frequency analysis with frequency components, resulting from the component 12, with a variable allowance width, and for determining the presence of abnormality and the abnormal portion in the component 12, based on the collated result. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006234786(A) 申请公布日期 2006.09.07
申请号 JP20050176507 申请日期 2005.06.16
申请人 NSK LTD 发明人 MIYASAKA TAKANORI;MUTO YASUYUKI
分类号 G01M99/00;G01H17/00 主分类号 G01M99/00
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