| 摘要 |
PROBLEM TO BE SOLVED: To provide a command tester for detecting a failure caused by to a hardware defective obstacle generated in the input/output section of equipment under test such as a storage product in an early stage. SOLUTION: This command tester is provided with a processor 2-1 for control for controlling a channel adapter 3 mounted on a host interface rack, and for managing access with equipment under test connected to a channel adapter, a plurality of back panels BP to which channel adapters 3 which can be controlled by a processor 1-1 for control are connected, a plurality of data managing means 2-2 and 2-3 having comparing means and a host interface mounted rack 2 equipped with a switching means for selectively connecting the data managing means 2-2 and 2-3 to the channel adapter. An exclusive program for the channel adapter is downloaded to the channel adapter 3 by the processor for control at the time of IPL, and control with the equipment under test connected to the channel adaptor is executed. COPYRIGHT: (C)2006,JPO&NCIPI
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