| 发明名称 |
Integrated fault detector circuit |
| 摘要 |
According to one embodiment, an integrated fault detector circuit is used to detect one or more of the open circuit and short circuit of a load connected to an integrated circuit power MOSFET driver by directly detecting the level of current flowing in a floating current source.
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| 申请公布号 |
US7102359(B2) |
申请公布日期 |
2006.09.05 |
| 申请号 |
US20050247480 |
申请日期 |
2005.10.11 |
| 申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
ALLEN GORDON H.;BILLS PETER J.;QUINONES BRYAN |
| 分类号 |
G01R31/08;H03K5/22 |
主分类号 |
G01R31/08 |
| 代理机构 |
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| 主权项 |
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