| 摘要 |
<p>A test apparatus and a test method of an electronic device are disclosed. The test apparatus according to the present invention includes an editor, a test execution unit and a storage unit. The editor sets test data based on kinds of the electronic device. The test execution unit tests states of the electronic device based on the test data, corresponding to the kinds of the electronic device. The storage unit stores the test data and the test result of the test execution unit. Therefore, the present invention sets test data once and enables a plurality of test apparatuses to perform test operations based on the set test data, thereby eliminating the inconvenience entailed in the prior art techniques wherein test data must be set each a test is to be performed.</p> |
