发明名称 |
METHOD FOR FORMING ORGANOSILICON FILM, SEMICONDUCTOR DEVICE HAVING SUCH ORGANOSILICON FILM AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>Disclosed is a method for forming an organosilicon film having low dielectric constant and little leakage current. Specifically disclosed is a method for forming an organosilicon film by chemical vapor deposition using an organosilicon compound as a raw material gas, wherein an organosilicon compound containing at least silicon, hydrogen and carbon as constitutional elements and having, in a molecule, two or more groups having an unsaturated bond is used while being mixed with a silicon hydride gas.</p> |
申请公布号 |
WO2006088015(A1) |
申请公布日期 |
2006.08.24 |
申请号 |
WO2006JP302525 |
申请日期 |
2006.02.14 |
申请人 |
NEC CORPORATION;TADA, MUNEHIRO;TAKEUCHI, TSUNEO;HAYASHI, YOSHIHIRO |
发明人 |
TADA, MUNEHIRO;TAKEUCHI, TSUNEO;HAYASHI, YOSHIHIRO |
分类号 |
H01L21/312;C07F7/08;H01L21/768;H01L23/522 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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