发明名称 METHOD FOR FORMING ORGANOSILICON FILM, SEMICONDUCTOR DEVICE HAVING SUCH ORGANOSILICON FILM AND METHOD FOR MANUFACTURING SAME
摘要 <p>Disclosed is a method for forming an organosilicon film having low dielectric constant and little leakage current. Specifically disclosed is a method for forming an organosilicon film by chemical vapor deposition using an organosilicon compound as a raw material gas, wherein an organosilicon compound containing at least silicon, hydrogen and carbon as constitutional elements and having, in a molecule, two or more groups having an unsaturated bond is used while being mixed with a silicon hydride gas.</p>
申请公布号 WO2006088015(A1) 申请公布日期 2006.08.24
申请号 WO2006JP302525 申请日期 2006.02.14
申请人 NEC CORPORATION;TADA, MUNEHIRO;TAKEUCHI, TSUNEO;HAYASHI, YOSHIHIRO 发明人 TADA, MUNEHIRO;TAKEUCHI, TSUNEO;HAYASHI, YOSHIHIRO
分类号 H01L21/312;C07F7/08;H01L21/768;H01L23/522 主分类号 H01L21/312
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