发明名称 Method of making CMOS devices on strained silicon on glass
摘要 A method of making CMOS devices on strained silicon on glass includes preparing a glass substrate, including forming a strained silicon layer on the glass substrate; forming a silicon oxide layer by plasma oxidation of the strained silicon layer; depositing a layer of doped polysilicon on the silicon oxide layer; forming a polysilicon gate; implanting ions to form a LDD structure; depositing and forming a spacer dielectric on the gate structure; implanting and activation ions to form source and drain structures; depositing a layer of metal film; annealing the layer of metal film to form salicide on the source, drain and gate structures; removing any unreacted metal film; depositing a layer of interlayer dielectric; and forming contact holes and metallizing.
申请公布号 US2006189111(A1) 申请公布日期 2006.08.24
申请号 US20050060878 申请日期 2005.02.18
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 LEE JONG-JAN;MAA JER-SHEN;TWEET DOUGLAS J.;ONO YOSHI;HSU SHENG T.
分类号 H01L21/44 主分类号 H01L21/44
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