发明名称 SEMICONDUCTOR OXIDATION APPARATUS AND METHOD OF PRODUCING SEMICONDUCTOR ELEMENT
摘要 <p>A semiconductor oxidation apparatus is provided with a sealable oxidation chamber defined by walls, a base provided within the oxidation chamber and configured to support a semiconductor sample, a supply part configured to supply water vapor into the oxidation chamber to oxidize a specific portion of the semiconductor sample, a monitoring window provided in one of the walls of the oxidation chamber and disposed at a position capable of confronting the semiconductor sample supported on the base, a monitoring part provided outside the oxidation chamber and capable of confronting the semiconductor sample supported on the base via the monitoring window, and an adjusting part configured to adjust a distance between the base and the monitoring part.</p>
申请公布号 WO2006088166(A1) 申请公布日期 2006.08.24
申请号 WO2006JP302898 申请日期 2006.02.13
申请人 RICOH COMPANY, LTD.;SATO, SHUNICHI;JIKUTANI, NAOTO;ITOH, AKIHIRO;UMEMOTO, SHINYA;ZENNO, YOSHIAKI;YAMAMOTO, TAKATOSHI 发明人 SATO, SHUNICHI;JIKUTANI, NAOTO;ITOH, AKIHIRO;UMEMOTO, SHINYA;ZENNO, YOSHIAKI;YAMAMOTO, TAKATOSHI
分类号 H01L21/31;H01S5/183 主分类号 H01L21/31
代理机构 代理人
主权项
地址