MEHTOD FOR TESTING SEMICONDUCTOR CHIP,申请号KR20050013879-传众专利搜索

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发明名称	MEHTOD FOR TESTING SEMICONDUCTOR CHIP
摘要
申请公布号	KR20060092755(A)	申请公布日期	2006.08.23
申请号	KR20050013879	申请日期	2005.02.19
申请人	LG ELECTRONICS INC.	发明人	SHIN, YONG SEUNG
分类号	G01R31/3183	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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