发明名称 Method of forming gate of flash memory cell
摘要 A method of forming a gate of a flash memory cell, by which a coupling effect between floating and control gates can be enhanced by forming a polysilicon spacer in forming the floating gate to increase a surface area of the floating gate. The gate is formed by forming a nitride layer pattern on a substrate to define a prescribed space, forming a polysilicon spacer at a sidewall of the nitride layer pattern within the defined space on the first polysilicon, and removing the nitride layer pattern.
申请公布号 US7094643(B2) 申请公布日期 2006.08.22
申请号 US20040022648 申请日期 2004.12.28
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 YOON CHUL JIN
分类号 H01L21/336;H01L21/8238;H01L21/8247;H01L27/115;H01L29/788 主分类号 H01L21/336
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