| 摘要 |
A method for testing high-voltage alternating-current power switches in a synthetic test circuit has the step of connecting a high-voltage oscillating circuit in parallel to a test switch B<SUB>t </SUB>in a time interval before the current zero of an interruptible high current, which is determined by a half-cycle duration (T<SUB>h</SUB>/2) of the oscillating current (i<SUB>h</SUB>) less the duration of equivalence (Deltat<SUB>se</SUB>) of the sole flow of the oscillating current as sequential current in the test switch with a stress exerted upon the switch by the homogeneous current in a direct test circuit. The sequential-current flow duration of the equivalence results, at least approximately, from the comparison of the values of common physical stress parameters acting in the test switch during the test, on the one hand, in the synthetic test circuit and, on the other hand, in the direct test circuit.
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