发明名称 ALIGNMENT SYSTEM USED IN NANO-IMPRINT LITHOGRAPHY AND NANO-IMPRINT LITHOGRAPHY METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an alignment system for nano-imprint lithography. SOLUTION: The alignment system includes a plurality of electron emission devices 132, which are provided in a mold 130 and emit electrons; and a plurality of electrodes 112, which are provided to face the electron emission devices and at which the electrons emitted from the electron emission devices arrive. A substrate 110 and the mold 130 are aligned with each other by adjusting the positions of the mold and substrate, and the amount of current in the electrode is maximized. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216952(A) 申请公布日期 2006.08.17
申请号 JP20060023873 申请日期 2006.01.31
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 CHOI SANG-JUN;RI SHOKEN;LEE SUK-WON;LEE MOON-GU
分类号 H01L21/027 主分类号 H01L21/027
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