发明名称 EVALUATING METHOD OF THIN FILM MAGNETIC HEAD
摘要 PROBLEM TO BE SOLVED: To obtain an evaluating method of a thin film magnetic head in which a quality of an output property can be evaluated highly accurately by eliminating defective products possibly causing degradation and instability. SOLUTION: In the thin film magnetic head having an antiferromagnetic layer 12, a fixed magnetic layer 13, a non-magnetic conduction layer 14, a spin valve film obtained by laminating free magnetic layers 15, and a hard bias film 20 contacted to both sides of a track width direction of the spin valve film, first, the hard bias film 20 is magnetized in the direction of track width of the hard bias film 20 (first magnetization process), an alternating electric field is applied and the head output property is measured (first measuring process). Next, after the hard bias film 20 is magnetized in the height direction being orthogonal to the track width direction, processing for magnetization in the track width direction is performed at least once, the alternating electric field is applied with the same condition as the first time and the head output property is measured (second measuring process). The quality of the head output property is discriminated by comparing the first time measured result with the second time measured result. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216202(A) 申请公布日期 2006.08.17
申请号 JP20050030730 申请日期 2005.02.07
申请人 ALPS ELECTRIC CO LTD 发明人 YANAGI SHUJI;TAKAHASHI AKIRA;KAKUBARI HIRONARI;YAMASHITA TOMOHIRO
分类号 G11B5/455;G11B5/39 主分类号 G11B5/455
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