发明名称 Bond pad structure for integrated circuit chip
摘要 An integrated circuit chip is provided, which includes a bond pad structure. The bond pad structure includes a bond pad, a first metal plate, and a second metal plate. The first metal plate is located under the bond pad. The first metal plate has a first outer profile area. The second metal plate is located under the first metal plate. A cumulative top view outer profile area of the first metal plate and the second metal plate is larger than the first outer profile area of the first metal plate. The second metal plate may have a second outer profile area that is substantially equal to or larger than the first outer profile area. A first vertical axis may extend through a centroid of the first metal plate, and a centroid of the second metal plate may be laterally offset relative to the first vertical axis.
申请公布号 US2006180946(A1) 申请公布日期 2006.08.17
申请号 US20050058392 申请日期 2005.02.15
申请人 CHEN HSIEN-WEI 发明人 CHEN HSIEN-WEI
分类号 H01L23/48 主分类号 H01L23/48
代理机构 代理人
主权项
地址