发明名称 System and method for the measurement of the layer thickness of a multi-layer pipe
摘要 System for measuring layer thicknesses of a multi-layer pipe by measuring with a detector array ( 2 ) the attenuation of an X-ray transmitted though the pipe. According to the invention the detector array ( 2 ) comprises an array of detector elements D<SUB>1</SUB>, D<SUB>2</SUB>, D<SUB>3</SUB>, D<SUB>4 </SUB>with a collimator for defining the field of radiation in front of each detector element. The collimator has a narrow diaphragm aperture setting the resolution when the position of the pipe walls is to be determined. The defined field of radiation has an extent sufficient to radiate the four detector elements D<SUB>1</SUB>, D<SUB>2</SUB>, D<SUB>3</SUB>, D<SUB>4 </SUB>in parallel. In a suitable signal processing of the output signals from the detector elements D<SUB>1</SUB>, D<SUB>2</SUB>, D<SUB>3</SUB>, D<SUB>4</SUB>, eg by using the method of least squares, the thicknesses of the different layers may be fairly accurately determined.
申请公布号 US7092486(B2) 申请公布日期 2006.08.15
申请号 US20040475944 申请日期 2004.06.30
申请人 FORCE TECHNOLOGY 发明人 OLESEN FINN FALLENTIN;FINK JOERGEN;NIELSEN BILL SEJER
分类号 G01B15/06;G01B15/02 主分类号 G01B15/06
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