发明名称 SCANNING LASER MICROSCOPE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a scanning laser microscope system, with which the optical axes of a plurality of laser beams can be made to coincide using a simple constitution. SOLUTION: The scanning type microscope system 1 scans, while irradiating a specimen with a first laser beam and a second laser beam and captures an observation image, based on the light emitted from the specimen. The scanning type microscope system 1 includes a position detector 11 for detecting the position of the optical axis of the first laser beam in the offset position of a scanning unit 5 that scans the first laser beam and the position of the optical axis of the second laser beam, in the offset position of a scanning unit 22 that scans the second laser beam; and a control section 17, that corrects the offset position of the scanning unit 22, based on the positions of the first and the second optical axes detected by the position detector 11 and makes corrections so that the positions of the first and the second optical axes detected by the position detector 11 are made to coincide. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006208590(A) 申请公布日期 2006.08.10
申请号 JP20050018587 申请日期 2005.01.26
申请人 OLYMPUS CORP 发明人 AKITANI AKINORI
分类号 G02B21/00 主分类号 G02B21/00
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