发明名称 PLANAR OXIDATION METHOD FOR PRODUCING A LOCALISED BURIED INSULATOR
摘要 <p>The invention relates to a method of producing a semiconductor device, comprising the following steps consisting in: forming first, second and third semiconductor layers (1, 2, 3), whereby the first and second layers (1, 3) contain a smaller concentration of oxidisable species than the second layer (2); forming a mask (4) on the third layer (3); and oxidising the second layer (2) with the diffusion of oxidising species through the third layer (3).</p>
申请公布号 WO2006082322(A1) 申请公布日期 2006.08.10
申请号 WO2006FR00242 申请日期 2006.02.02
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE-CNRS-;ALMUNEAU, GUILHEM;MUNOZ-YAGUE, ANTONIO;CAMPS, THIERRY;FONTAINE, CHANTAL;BARDINAL-DELAGNES, VERONIQUE 发明人 ALMUNEAU, GUILHEM;MUNOZ-YAGUE, ANTONIO;CAMPS, THIERRY;FONTAINE, CHANTAL;BARDINAL-DELAGNES, VERONIQUE
分类号 H01S5/183;H01L21/316 主分类号 H01S5/183
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