发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of a high-reliability circuit operation by suppressing electric charges to be discharged from a holding node via the parasitic capacitance of fuse wirings. <P>SOLUTION: The semiconductor integrated circuit has an internal circuit 200, a fuse circuit 20 for setting the circuit operation of the internal circuit 200, and a protective capacitance 30 to be coupled capacitively to the parasitic capacitance C1 of the fuse circuit 20. This semiconductor integrated circuit is provided with a latching circuit 10 for holding a signal FINT to be made to propagate to the internal circuit 20. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006210398(A) 申请公布日期 2006.08.10
申请号 JP20050016768 申请日期 2005.01.25
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 ISHIZUKA KENJI;MURAOKA KAZUYOSHI
分类号 H01L21/82;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/82
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