发明名称 INSPECTION INFORMATION MANAGEMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an inspection information management system by software and an inspection server capable of managing the data of inspection results with respect to the quality between inspection devices, along with consolidating inspection results of the quality of the inspection devices. SOLUTION: The inspection information management system is constituted such that; two or more inspection devices are arranged in a process in the manufacturing process of a substrate board, which is assembled into one component after it is manufactured in a reel form and a pattern is formed sequentially on a substrate; the inspection results are integrally managed by performing inspection while recognizing the identification code individually given to each substrate, after the inspection results are registered for every identification code; and the quality result of the substrate board for every identification code can be outputted by adding a system procedure to the inspection information management system, so as to perform the logical addition of the inspection results after extracting all the inspection results in an optional inspection device group based on the identification code. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006210663(A) 申请公布日期 2006.08.10
申请号 JP20050021046 申请日期 2005.01.28
申请人 TOPPAN PRINTING CO LTD 发明人 TOMII SHUZO
分类号 H01L21/60 主分类号 H01L21/60
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