发明名称 |
PHASE SHIFT MASK ELIMINATING PHASE CONFLICT DEFECT |
摘要 |
A phase shift mask (PSM) is provided. The PSM includes a light-transmitting substrate, a light-blocking region, a first light-transmitting region, and a second light-transmitting region. The light-blocking region is formed in the light-transmitting substrate. The first light-transmitting region is formed as both a first phase shift region for transmitting 0°-phase shifted light and as a first polarization region for TE-polarizing the transmitted light. The second light-transmitting region contacts the first light-transmitting region to form a boundary. The second light-transmitting region is formed in the light-transmitting substrate as a second phase shift region for transmitting 180°-phase shifted light and as a second polarization region for TM-polarizing the transmitted light to prevent a phase conflict at the boundary. |
申请公布号 |
KR20060089550(A) |
申请公布日期 |
2006.08.09 |
申请号 |
KR20050011012 |
申请日期 |
2005.02.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HUH, SUNG MIN;KIM, HEE BOM;CHOI, SEONG WOON;PARK, JIN HONG |
分类号 |
H01L21/027;G03F1/08 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|