发明名称 Manufacture of probe unit having lead probes extending beyond edge of substrate
摘要 A sacrificial layer is formed in a recess of a substrate, and leads extending from the substrate into an area of the sacrificial layer are formed. A cut is formed from the bottom surface of the substrate, the cut extending from the bottom surface to the area of the sacrificial layer via the substrate, then the sacrificial layer is removed. A probe unit can be obtained having the leads whose front portions extend beyond the edge of the substrate. A through conductor may be formed in a through hole formed in a substrate. Leads may be formed on a photosensitive etching glass substrate to thereafter selectively etch the chemically cutting type glass.
申请公布号 US7087501(B2) 申请公布日期 2006.08.08
申请号 US20050179659 申请日期 2005.07.13
申请人 YAMAICHI ELECTRONICS, CO., LTD. 发明人 HATTORI ATSUO;YOSHINO TOSHITAKA;HAMANO TETSUTSUGU;SUGIURA MASAHIRO
分类号 G01R31/26;H01L21/46;G01R1/067;G01R1/073;G01R3/00;H01L21/301;H01L21/66;H01L21/78 主分类号 G01R31/26
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