发明名称 |
Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure |
摘要 |
A probe device including a cantilever. A probe is attached to the cantilever and is allocated to be opposed to a surface of a sample attached thereto. An apparatus is provided with the probe device, which is capable of carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.
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申请公布号 |
US7088120(B2) |
申请公布日期 |
2006.08.08 |
申请号 |
US20050065025 |
申请日期 |
2005.02.25 |
申请人 |
OSAKA UNIVERSITY |
发明人 |
MATSUMOTO TAKUYA;OTSUKA YOICHO;NAITOH YASUHISA;KAWAI TOMOJI |
分类号 |
G01R31/02;G01Q60/00;G01Q60/34;G01Q60/38;G01Q60/40;G01R27/08 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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