发明名称 Seed-Reparatur tiefer Kontaktlöcher (Via) unter Verwendung stromloser Beschichtungschemie
摘要 <p>Methods of forming a continuous seed layer in a high aspect via and its associated structures are described. Those methods comprise forming a recess in a substrate, forming a non-continuous metal layer within the recess, activating the non-continuous metal layer and a plurality of non-deposited regions within the recess, electrolessly depositing a seed layer on the activated non-continuous metal layer and the plurality of non-deposited regions within the recess, and electroplating a metal fill layer over the seed layer, to form a substantially void-free metal filled recess.</p>
申请公布号 DE112004001684(T5) 申请公布日期 2006.08.03
申请号 DE20041101684 申请日期 2004.09.23
申请人 INTEL CORPORATION 发明人 DORY, THOMAS;WONG, KENNETH
分类号 H01L21/288;H01L21/768 主分类号 H01L21/288
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