发明名称 INTEGRATED CIRCUIT, AND INSPECTION DEVICE AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To efficiently carry out inspection of an LSI and logical verification thereof, in correspondence to version-up, addition or the like of IP (Intelectual Property). SOLUTION: A referring address of a test pattern 114 is registered in a test vector table 115 to be correlated with the core number and the version number of the IP used in the LSI of an inspection object. A register block 106 registered with the core number and the version number of the used IP is provided in the inspection object LSI 101. An LSI tester 111 acquires the core number and the version number of the used IP, referring to the register block 106, and acquires the test pattern 114, referring to the test vector table 115. The LSI tester 111 executes a test program 113 using the acquired test pattern 114, and tests the LSI 101. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006201088(A) 申请公布日期 2006.08.03
申请号 JP20050014685 申请日期 2005.01.21
申请人 CANON INC 发明人 WAKINO SHIORI
分类号 G01R31/3183 主分类号 G01R31/3183
代理机构 代理人
主权项
地址