Linearity checking tool for ultrasonic examination instrument,申请号KR20040087447-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Linearity checking tool for ultrasonic examination instrument
摘要
申请公布号	KR100607079(B1)	申请公布日期	2006.08.02
申请号	KR20040087447	申请日期	2004.10.29
申请人		发明人
分类号	G01N29/22;G01M99/00	主分类号	G01N29/22
代理机构		代理人
主权项
地址

您可能感兴趣的专利

COMPONENT MOUNTING SYSTEM AND COMPONENT MOUNTING METHOD

DIFFRACTION GRATING FOR X-RAY INTERFEROMETER AND MANUFACTURING METHOD THEREOF

CHARGING DEVICE AND IMAGE FORMING DEVICE

INFORMATION PROCESSING UNIT, LOG STORAGE CONTROL PROGRAM, AND LOG STORAGE CONTROL METHOD

ROTARY PENETRATION CONSTRUCTION METHOD AND ROTARY PENETRATION DEVICE

TRANSPARENT DOUBLE-SIDED PRESSURE-SENSITIVE ADHESIVE SHEET AND IMAGE DISPLAY

SLURRY TYPE RECONSTRUCTION PROPULSION UNIT AND SLURRY TYPE EARTH REMOVAL METHOD

POWER SUPPLY SYSTEM FOR VEHICLE

FLEXURE REGULATION STRUCTURE, AND WIRE HARNESS

AUTONOMOUS MOBILE SYSTEM, METHOD OF CONTROLLING THE SAME, AND PROGRAM

HEAD-PROTECTING AIRBAG DEVICE

SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD OF THE SAME, AND CAMERA MODULE

IGFBP2 INHIBITOR

HEAT DISSIPATION SUBSTRATE, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR MODULE

METAL CHLORIDE GAS GENERATOR AND METAL CHLORIDE GAS GENERATION METHOD, AND HYDRIDE VAPOR PHASE EPITAXIAL GROWTH APPARATUS, NITRIDE SEMICONDUCTOR WAFER, NITRIDE SEMICONDUCTOR DEVICE, WAFER FOR NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE, MANUFACTURING METHOD OF NITRIDE SEMICONDUCTOR SELF-SUPPORTING SUBSTRATE, AND NITRIDE SEMICONDUCTOR CRYSTAL

PROTRUDED CORNER PROTECTIVE COVER, AND PROTECTIVE COVER DEVICE

METHOD FOR EXTRACTING FLOOD PREDICTED SPOT FROM LASER PROFILER DATA

SCANNING DISPLAY DEVICE