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发明名称
半导体晶片之直接电性连接覆晶封装结构
摘要
一种半导体晶片之直接电性连接覆晶封装结构,主要系包括:至少一介电层;至少一半导体晶片,且该半导体晶片主动面形成有电性连接垫,并以其主动面接置于该介电层上;以及至少一线路层,系形成于该介电层上未供接置半导体晶片之一侧,且该线路层系藉由复数形成于该介电层中之导电电极以电性连接至该半导体晶片上之电性连接垫。由于该半导体晶片之非主动面得以直接外露出,而可提升散热效率,同时进一步缩减构装结构之整体高度,以有效达到轻薄短小目的。
申请公布号
TW200627615
申请公布日期
2006.08.01
申请号
TW094101281
申请日期
2005.01.17
申请人
全懋精密科技股份有限公司
发明人
许诗滨
分类号
H01L23/52
主分类号
H01L23/52
代理机构
代理人
陈昭诚
主权项
地址
新竹市东区新竹科学工业园区力行路6号
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