发明名称 Inspection Device for Device Under Test
摘要 PROBLEM TO BE SOLVED: To suppress the increase of the occupied area of a device as well as the rising of a cost to the minimum in accordance with upsizing of a board to be inspected. SOLUTION: An inspection stage which receives a board to be inspected from a delivery apparatus is selectively displaced by a displacement mechanism either to the delivery position where the received board comes to be horizontal or to an inspection position where the received board comes to be declined. COPYRIGHT: (C)2004,JPO
申请公布号 KR100607151(B1) 申请公布日期 2006.08.01
申请号 KR20030015470 申请日期 2003.03.12
申请人 发明人
分类号 G01R31/00 主分类号 G01R31/00
代理机构 代理人
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