发明名称 Probe card assembly
摘要 A method and apparatus for testing, the apparatus including: a probe array mounted on an inner portion of a gimbaled bearing, the inner portion of the gimbaled bearing having a spherical surface defined by a surface of a first sphere between two parallel small circles of the first sphere, a radius of the first sphere centered on a point on a top surface of the probe array; and an outer portion of the gimbaled bearing, the outer portion of the gimbaled bearing having a spherical surface defined by the surface of a second sphere between two parallel small circles of the second sphere, a radius of the second sphere centered on the point on the top surface of the probe array.
申请公布号 US7084651(B2) 申请公布日期 2006.08.01
申请号 US20040710677 申请日期 2004.07.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 AUDETTE DAVID M.;GARDELL DAVID L.;HAGIOS JOHN F.;SULLIVAN CHRISTOPHER L.
分类号 G01R31/02 主分类号 G01R31/02
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