发明名称 A METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>A TFT having stable characteristics is obtained by using a crystal silicon film obtained by crystallizing an amorphous silicon film by using nickel. Phosphorus ions are implanted to regions 111 and 112 by using a mask 109. Then, a heat treatment is performed to getter nickel existing in a region 113 to the regions 111 and 112. Then, the mask 109 is side-etched to obtain a pattern 115. Then, the regions 111 and 112 are removed by utilizing the pattern 115 and to pattern the region 113. Thus, a region 116 from which nickel element has been removed is obtained. The TFT is fabricated by using the region 116 as an active layer. <IMAGE></p>
申请公布号 KR20060086811(A) 申请公布日期 2006.08.01
申请号 KR20050086280 申请日期 2005.09.15
申请人 SEMICONDUCTOR ENERGY LABORATORY K.K. 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI;OHNUMA HIDETO
分类号 G02F1/136;H01L29/786;G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84 主分类号 G02F1/136
代理机构 代理人
主权项
地址