发明名称 METHOD FOR FABRICATING METAL-INSULATOR-METAL CAPACITOR AND MIM CAPACITOR
摘要 <p>In a method of fabricating a metal-insulator-metal (MIM) capacitor and a metal-insulator-metal (MIM) capacitor fabricated according to the method, the method comprises: forming an insulating-layer pattern on a semiconductor substrate, the insulating-layer pattern having a plurality of openings that respectively define areas where capacitor cells are to be formed; forming a lower electrode conductive layer on the insulating-layer pattern and on the semiconductor substrate; forming a first sacrificial layer that fills the openings on the lower electrode conductive layer; forming a second sacrificial layer on of the first sacrificial layer; planarizing the second sacrificial layer; exposing an upper surface of the lower electrode conductive layer; removing the exposed lower electrode conductive layer to form a plurality of lower electrodes that are separated from each other, each corresponding to a capacitor cell; and forming dielectric layers and upper electrodes, that are separated from each other, each corresponding to a capacitor cell, on each of the lower electrodes to provide a plurality of MIM capacitor cells constituting one capacitor to which the same electric signal is applied.</p>
申请公布号 KR20060085844(A) 申请公布日期 2006.07.28
申请号 KR20050006779 申请日期 2005.01.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JUNG MIN;WON, SEOK JUN;SONG, MIN WOO;JEONG, YONG KUK;KIM, WEON HONG;KWON, DAE JIN
分类号 H01L27/04;H01L21/31 主分类号 H01L27/04
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