发明名称 SINGLE WAVELENGTH STIMULATED EMISSION DEPLETION MICROSCOPY
摘要 In apparatus for superresolution microscopy or microlithography, wherein a spot in the specimen to be examined or in the microlithographic medium is raised to an excited state by a first pulse of light, and a second pulse of light reduces the excitation in the peripheral parts of the spot to increase the resolution of the instrument, a method whereby the wavelength of the second pulse in the specimen or medium is the same as the wavelength of the first pulse, thereby allowing the cost and complexity of the apparatus to be lowered.
申请公布号 WO2006078857(A2) 申请公布日期 2006.07.27
申请号 WO2006US01961 申请日期 2006.01.17
申请人 BAER, STEPHEN, C. 发明人 BAER, STEPHEN, C.
分类号 B01D59/44 主分类号 B01D59/44
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