发明名称 METHOD FOR FORMING RESIST PATTERN BY LIQUID-IMMERSION EXPOSURE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for forming a resist pattern which can form a micro and precise resist pattern even if a liquid-immersion exposure method is adopted. <P>SOLUTION: The method for forming a resist pattern includes an exposure step wherein a light is given to the specified position of a photo resist film formed on a substrate while a liquid is used as a medium, a post-exposure bake (PEB) step to heat the photo resist film after the exposure step, and a developing step to develop the photo resist film given by the light in the exposure step after the PEB step. In this case, a step is added after the exposure step and before the PEB step, so as to reduce or remove a liquid being still left at least at any position on the upper surface of the photo resist film, the side surface of the substrate and the rear surface thereof. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006196575(A) 申请公布日期 2006.07.27
申请号 JP20050004970 申请日期 2005.01.12
申请人 JSR CORP 发明人 HIEDA KATSUHIKO
分类号 H01L21/027;G03F7/38 主分类号 H01L21/027
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