摘要 |
PROBLEM TO BE SOLVED: To provide a circuit operation verification method, a circuit operation verification device, and a computer program, capable of correctly and speedily verifying whether or not a circuit element built in a semiconductor integrated circuit malfunctions by considering each voltage drop of power supply wiring and grounding wiring. SOLUTION: Based on a function showing the relation between the total amount of voltage drops and the amount of a delay variation, the amount of an allowable power supply voltage dropΔV<SB>DDY</SB>and the amount of an allowable grounding voltage dropΔV<SB>SSY</SB>corresponding to the amount of the delay variation P<SB>Y</SB>which satisfies design constraints are determined, and when the amount of a power supply voltage dropΔV<SB>DDDC</SB>of the circuit element determined based on mask layout data is smaller thanΔV<SB>DDY</SB>, or the amount of a grounding voltage dropΔV<SB>SSDC</SB>is smaller thanΔV<SB>SSY</SB>, the circuit element is determined to malfunction. COPYRIGHT: (C)2006,JPO&NCIPI
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