发明名称 SURFACE PROFILE MEASUREMENT METHOD UNDER LIQUID AND ITS SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface profile measurement method under liquid and its system in which compensation for determining the depth from a liquid surface to an object is considered by photographing position information for an image and the refractive index of the liquid. <P>SOLUTION: The surface profile measurement method under liquid comprises a data creation section 1 which performs digital mapping on a stereoscopic image using a digital mapping device and creates data on position information 2 of an image photographing device A placed on the left, position information 3 of an image photographing device B placed on the right, and a DEM value 4 and a computer 10 comprising a refractive index value input section 11, a calculation section 12 for calculating lateral liquid surface reaching coordinates, a lateral incident angle, and a lateral refraction angle, a two-dimension/three-dimension decision section 13, a two-dimensional true value calculation section 14, a decision section 15 for the three-dimensional incident angles of the two image photographing devices, a calculation section 16 for the case in which the three-dimensional incident angles are the same, a calculation section 17 for the case in which the three-dimensional incident angles are different, a creation section 18 for creating the surface profile of the object under liquid on the basis of the calculated two-dimensional and three-dimensional true values, and a storage section 19 for storing information of above-described sections. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006194705(A) 申请公布日期 2006.07.27
申请号 JP20050005824 申请日期 2005.01.13
申请人 NATIONAL INSTITUTE FOR ENVIRONMENTAL STUDIES;YAMANO HIROYA;SUZUKI YASUHIRO;MURASE AKIMI 发明人 YAMANO HIROYA;SUZUKI YASUHIRO;MURASE AKIMI;MIYASHITA YOSHIKO;OKAWA NAOTO;TANI TOMOYOSHI;TANAKA YOSHIO
分类号 G01C11/06;G01B11/24;G01B11/245;G06T1/00 主分类号 G01C11/06
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