发明名称 |
METHOD AND APPARATUS FOR RAPID SAMPLE PREPARATION IN A FOCUSED ION BEAM MICROSCOPE |
摘要 |
<p>A coupon for preparing a TEM sample holder comprises a sheet of material that includes a TEM sample holder form. There is at least one section of the sheet connecting the TEM sample holder form to other portions of the sheet. A TEM sample holder is formed by cutting the TEM sample holder form from the coupon in a press. The cutting joins the tip point of a nano-manipulator probe tip with the formed TEM sample holder. The tip point of the probe has a sample attached for inspection in a TEM.</p> |
申请公布号 |
EP1682254(A2) |
申请公布日期 |
2006.07.26 |
申请号 |
EP20040810249 |
申请日期 |
2004.11.03 |
申请人 |
OMNIPROBE, INC. |
发明人 |
MOORE, THOMAS |
分类号 |
B01F1/00;B01F;H01J37/20;H01J37/305 |
主分类号 |
B01F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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