发明名称 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
摘要 A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.
申请公布号 US7079666(B2) 申请公布日期 2006.07.18
申请号 US20010814618 申请日期 2001.03.22
申请人 SOLVISION INC. 发明人 COULOMBE ALAIN;CANTIN MICHEL;NIKITINE ALEXANDRE
分类号 G01B11/25;G06K9/00;G01B;G01B11/24;G01B11/30;H04N13/00;H04N15/00 主分类号 G01B11/25
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