发明名称 Method of improving data retention ability of semiconductor memory device, and semiconductor memory device
摘要 This invention is a method of improving a data retention ability of a semiconductor memory device having a plurality of nonvolatile memory cells storing a plurality of memory states. The method includes the steps of: (a) selecting the nonvolatile memory cells in a first memory group each of which accumulates charges higher in level than a first threshold from the plurality of nonvolatile memory cells; (b) extracting the nonvolatile memory cells in a first sub-group each of which accumulates the charges lower in level than a second threshold from the nonvolatile memory cells in the first memory group; and (c) programming the nonvolatile memory cells in the first sub-group until each of the nonvolatile memory cells accumulates the charges higher in level than the second threshold.
申请公布号 US7079421(B2) 申请公布日期 2006.07.18
申请号 US20040848313 申请日期 2004.05.19
申请人 SHARP KABUSHIKI KAISHA 发明人 YAOI YOSHIFUMI;IWATA HIROSHI;SHIBATA AKIHIDE;MORIKAWA YOSHINAO;NAWAKI MASARU
分类号 G11C11/34;G11C16/02;G11C16/10;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C11/34
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