发明名称 On-line thickness gauge and method for measuring the thickness of a moving glass substrate
摘要 An on-line thickness gauge (OLTG) and method are described herein that are capable of measuring a thickness of a moving glass substrate. In the preferred embodiment, the OLTG includes a Y-guide and a stabilizing unit that respectively captures and stabilizes the moving glass substrate. The OLTG also includes a laser instrument which contains a laser source and a detector. The laser source emits a beam at the front surface of the moving glass substrate. And, the detector receives two beams one of which was reflected by the front surface of the moving glass substrate and the other beam which was reflected by the back surface of the moving glass substrate. The OLTG further includes a processor that analyzes the two beams received by the detector to determine a distance between the two beams which is then used to determine the thickness of the moving glass substrate.
申请公布号 US2006150678(A1) 申请公布日期 2006.07.13
申请号 US20050034172 申请日期 2005.01.11
申请人 CHEN KENNETH C;LENHARDT EDWARD J;MA DANIEL Y;MCCREARY JEFFREY C;TERRELL JAMES P JR 发明人 CHEN KENNETH C.;LENHARDT EDWARD J.;MA DANIEL Y.;MCCREARY JEFFREY C.;TERRELL JAMES P.JR.
分类号 C03B5/24 主分类号 C03B5/24
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