Method for testing drive circuit, testing device and display device

摘要

A method of testing a drive circuit including a scan line drive circuit and a data line drive circuit for driving a display is disclosed. The display may include a plurality of scan lines and a plurality of data lines, each of said scan lines including an initial terminal coupled to said scan line drive circuit, each of said data lines including an initial terminal coupled to said data line drive circuit. The method includes: coupling each of said scan lines and each of said data lines to a first testing pad and a second testing pad respectively; sending a first testing signal to an input terminal of said scan line drive circuit and sending a second testing signal to an input terminal of said data line drive circuit; and testing at said first testing pad and said second testing pad respectively.