| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe for providing satisfactory contact at all times independently of the diameter of a solder ball, and especially, stabilizing contact resistance even if the diameter of the solder ball is larger than the diameter of a plunger end, and to provide a probe card. SOLUTION: This contact probe includes a plunger 12 to be put into contact with the solder ball formed on a body under inspection, and a barrel 11 for elastically urging the plunger 12 in the direction of a central axis A1 of the plunger 12. The plunger 12 comprises, at its one end, a contact part 12a making contact with the solder ball. The contact part 12a consists of two tip parts 13 each having an edge line 15. The respective tip parts 13 make contact with the solder ball on the respective edge lines 15. Contacting portions on the solder ball are all included in a range less than 180°with respect to the center of the solder ball when viewed in the direction of the central axis A1. COPYRIGHT: (C)2006,JPO&NCIPI
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