| 摘要 |
There is provided an on-chip test circuit that is capable of measuring validity of an output signal within a chip without any external measuring device. The on-chip self test circuit implemented on the same chip as a test semiconductor device includes: a test load block for receiving a test target signal; and a self test block for receiving a test target signal passing through the test load block and a test target signal inputted to an output driver together, and determining whether a change of the test target signal is within an allowable range. Accordingly, the validity of the signal outputted from the device can be measured without any expensive external measuring device. Also, when the test must be done before the packaging stage, the test can be simply performed, thereby reducing the test cost greatly.
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