| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection circuit and an inspection method for a thin-film transistor display array. SOLUTION: An inspection circuit and an inspection method of a thin-film transistor display circuit to be used for inspecting the quality of the thin-film transistor array are provided. The inspection circuit comprises an array tester, a test sample base, and a sense amplifier array. The sense amplifier array comprises a plurality of transimpedance amplifiers and a parasitic capacitance discharge circuit. Each sense amplifier has a transimpedance amplifier, comprising an operational amplifier, two switches, and an operation capacitance. The transimpedance amplifier is used to form an integration circuit, and its output is transferred to a sampling/holding circuit, through an output switch and converted into a digital signal by an analog/digital converter. The source parasitic capacitance discharge circuit of the thin film transistor array forms, in this discharge circuit, the discharge path of electric charge of the parasitic capacitance. COPYRIGHT: (C)2006,JPO&NCIPI
|
