发明名称 |
Semiconductor component test procedure, as well as a data buffer component |
摘要 |
A data buffer component and a semiconductor component test procedure for testing a memory module are provided. At least one memory component with a series-connected buffer is included. The procedure includes testing the memory module by using a pulse signal, which has been chronologically retarded or advanced by a predetermined time period in comparison with the memory module during normal operation.
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申请公布号 |
US2006156081(A1) |
申请公布日期 |
2006.07.13 |
申请号 |
US20050115390 |
申请日期 |
2005.04.27 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
BUCKSCH THORSTEN |
分类号 |
G11B20/20;G06K5/04;G11B5/00;G11C29/00;G11C29/50 |
主分类号 |
G11B20/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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