发明名称 |
Alignment self check for a wavelength meter |
摘要 |
An alignment self check of a wavelength meter is performed. A reference signal is placed into a reference signal path of the wavelength meter. The reference signal is also placed into an unknown signal path of the wavelength meter. It is then detected whether after traveling through the unknown signal path, the reference signal has a same period as after traveling through the reference signal path.
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申请公布号 |
US7075655(B2) |
申请公布日期 |
2006.07.11 |
申请号 |
US20030669035 |
申请日期 |
2003.09.23 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
MORRIS MICHAEL B. NORTH |
分类号 |
G01B9/02;G01J3/45;G01J9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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